9J-V Image Light Section Microscope
9J-V Image Light Section Microscope
9J-V Image Light Section Microscope
9J-V Image Light Section Microscope
9J-V Image Light Section Microscope
9J-V Image Light Section Microscope

9J-V Image Light Section Microscope

release time:2022-03-30 15:48:35

Product Category:Roughness measurement

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Description:

Purpose:The 9J-V image light section microscope is one of the original classic products of our company. It is an upgraded product of the basic 9J light section microscope, equipped with a digital imaging system. The instrument measures the microscopic unevenness of the machined surface of the part b...

Detailed

Purpose:

The 9J-V image light section microscope is one of the original classic products of our company. It is an upgraded product of the basic 9J light section microscope, equipped with a digital imaging system. The instrument measures the microscopic unevenness of the machined surface of the part by the light section method. It is suitable for measuring 1.0-80 microns, that is, the original standard ▽3-▽9 surface finish. It can also be used to measure the depth of surface scratches, scribes or certain defects.

The characteristics of light sectioning are carried out without damaging the surface. is an indirect measurement method. That is, the unevenness of the marks can be determined only after calculation.


the complete set of equipment:

1. 1 instrument body

2. 1 micrometer eyepiece

3. Coordinate table 1 piece

4. 1 V-block

5. Standard ruler (with box) 1 piece

6.7x objective lens 1 group

7. 14x objective lens 1 group

8. 30x objective lens 1 group

9. 60x objective lens 1 group

10. Adjustable transformer 220/4~6/5VA 1 piece

11. 2.1W 6V bulbs (spare parts) 3pcs

12. Digital camera system 1 set

13. 1 set of special adapter lens and interface (brand computer and printer can be purchased separately)


Specifications

Measuring range unevenness average height value

(microns)

Surface finish level required objective lens total magnification

Objective lens assembly

working distance

(mm)

field of view

(mm)

>1.0~1.6
>1.6~6.3
>6.3~20
>20~80
9
8~7
6~5
4~3
60×N.A.0.55
30×N.A.0.40
14×N.A.0.20
7×N.A.0.12

510×
260×
120×
60×

0.04
0.2
2.5
9.5
0.3
0.6
1.3
2.5

The magnification of the photographic device is about 6 times

Measuring unevenness range (1.0~80) microns

Uneven width with micrometer eyepiece 0.7μm~2.5mm

With coordinate table (0.01~13) mm

Instrument weight about 23 kg

Overall dimensions about 180 × 290 × 470 mm


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